What is Test analysis / Test Basis? or How to identify the test conditions?

Test analysis: identifying test conditions

  • Test analysis is the process of looking at something that can be used to derive test information.  This basis for the tests is called the test basis.
  • The test basis is the information we need in order to start the test analysis and   create our own test cases. Basically it’s a documentation on which test cases are based, such as requirements, design specifications, product risk analysis, architecture and interfaces.
  • We can use the test basis documents to understand what the system should do once built. The test basis includes whatever the tests are based on. Sometimes tests can be based on experienced user’s knowledge of the system which may not be documented.
  •  From testing perspective we look at the test basis in order to see what could be tested. These are the test conditions.  A test condition is simply something that we could test.
  • While identifying the test conditions we want to identify as many conditions as we can and then we select about which one to take forward and combine into test cases. We could call them test possibilities.
  • As we know that testing everything is an impractical goal, which is known as exhaustive testing. We cannot test everything we have to select a subset of all possible tests. In practice the subset we select may be a very small subset and yet it has to have a high probability of finding most of the defects in a system. Hence we need some intelligent thought process to guide our selection called test techniques. The test conditions that are chosen will depend on the test strategy or detailed test approach. For example, they might be based on risk, models of the system, etc.
  • Once we have identified a list of test conditions, it is important to prioritize them, so that the most important test conditions are identified. Test conditions can be identified for test data as well as for test inputs and test outcomes, for example, different types of record, different sizes of records or fields in a record. Test conditions are documented in the IEEE 829 document called a Test Design Specification.